02057nas a2200229   4500008004100000050001500041245011100056210006900167260002700236300001100263490000900274520128000283653002601563653002801589653001901617653002201636100002301658700002701681700002301708700002401731856007201755       1997                        eng d  aLBNL-4066800aEffective Medium Approximation of the Optical properties of electrochromic cerium-titanium oxide compounds0 aEffective Medium Approximation of the Optical properties of elec  aSan Diego, CAc07/1997  a19-Sep0 v31383 a<p>Cerium titanium oxide samples derived from a solution have been compared against sputtered films over a wide range of different compositions. X-ray diffraction was used to investigate the structural properties of the compound material existing in a two-phase mixture M<sub>A</sub>O<sub>2</sub>-M<sub>B</sub>O<sub>2</sub>. The optical properties were evaluated over the whole solar spectrum by variable angle spectroscopic ellipsometry combined with spectrophutometry. The spectral complex refractive index was determined for CeO<sub>2</sub> and TiO<sub>2</sub>, as well as for their compounds. To reduce the large number of permutations in composition of multi-component oxides it would be useful to be able to predict the properties of the mixtures from the pure oxide components. Therefore these results were compared to those obtained by effective medium theory utilizing the optical constants of CeO<sub>2</sub> and TiO<sub>2</sub>. In order to investigate the performance as passive counter-electrode in Li<sup>+</sup> based electrochromic devices the films were tested by cyclic voltammetry with in-situ transmission control. Chemical composition was measured by Rutherford backscattering spectrometry. Surface morphology was analyzed by atomic force microscopy.</p>10acerium titanium oxide10aeffective medium theory10aelectrochromic10aoptical constants1 avon Rottkay, Klaus1 aRichardson, Thomas, J.1 aRubin, Michael, D.1 aSlack, Jonathan, L.  uhttps://facades.lbl.gov/publications/effective-medium-approximation01789nas a2200205   4500008004100000245005300041210005300094260001200147300001000159490000800169520118600177653001801363653002901381653001901410653001901429100002301448700002301471700001701494856007201511       1996                        eng d00aOptical Indices of Electrochromic Tungsten Oxide0 aOptical Indices of Electrochromic Tungsten Oxide  c08/1997  a10-160 v3063 a<p>Tungsten trioxide (WO<sub>3</sub>) is the most widely used material for the active layer of electrochromic devices. Knowledge of the complex refractive index over the range of coloration states is required for device design. Optical constants of WO<sub>3</sub> over the whole solar spectrum were determined as a function of injected charge. Films of WO<sub>3</sub> were prepared by electron-beam evaporation, then colored in several steps by reduction with lithium (Li) up to 68 mC cm<sup>-2</sup> µm<sup>-1</sup> injected charge. Measurements included variable-angle spectroscopic ellipsometry and spectroscopic transmittance and reflectance at normal incidence. Analysis was complicated by the fact that a transparent-conducting layer of indium tin oxide (ITO) was required to perform lithiation. Optical indices of the glass substrate and ITO transparent conductor were determined separately and then fixed in the model. The indices of WO<sub>3</sub> could then be extracted from measurements on the complete structure. A parametric dispersion model corresponding to Gaussian broadening of the oscillators was used to represent the dielectric response of WO<sub>3</sub>.</p>10aColored state10aComplex refractive index10aelectrochromic10atungsten oxide1 avon Rottkay, Klaus1 aRubin, Michael, D.1 aWen, Shi-Jie  uhttps://facades.lbl.gov/publications/optical-indices-electrochromic